On test data compression using selective don't-care identification

Authors:
Terumine Hayashi;Haruna Yoshioka;Tsuyoshi Shinogi;Hidehiko Kita;Haruhiko Takase
Affiliations:
Department of Electrical and Electronic Engineering, Mie University, Tsu, Japan;Department of Electrical and Electronic Engineering, Mie University, Tsu, Japan;Department of Electrical and Electronic Engineering, Mie University, Tsu, Japan;Department of Electrical and Electronic Engineering, Mie University, Tsu, Japan;Department of Electrical and Electronic Engineering, Mie University, Tsu, Japan
Venue:
Journal of Computer Science and Technology
Year:
2005

Citing 12
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Abstract

This paper proposes an effective method for reducing test data volume under multiple scan chain designs. The proposed method is based on reduction of distinct scan vectors using selective don't-care identification. Selective don't-care identification is repeatedly executed under condition that each bit of frequent scan vectors is fixed to binary values (0 or 1). Besides, a code extension technique is adopted for improving compression efficiency with keeping decompressor circuits simple in the manner that the code length for infrequent scan vectors is designed as double of that for frequent ones. The effectiveness of the proposed method is shown through experiments for ISCAS'89 and ITC'99 benchmark circuits.