Test data compression using dictionaries with selective entries and fixed-length indices
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Proceedings of the conference on Design, automation and test in Europe - Volume 2
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Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
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Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
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Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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IEICE - Transactions on Information and Systems
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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Test data compression using efficient bitmask and dictionary selection methods
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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EDCC'05 Proceedings of the 5th European conference on Dependable Computing
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This paper presents a test input data compression technique, which can be use to reduce input test data volume, test time, and the number of required tester channels. The technique is based on grouping data packets and applying various binary encoding techniques, such as Huffman codes and Golomb-Rice codes. Experiments on actual industrial designs and benchmark circuits show an input vector data reduction ranging from 17x to 70x.