Test volume and application time reduction through scan chain concealment
Proceedings of the 38th annual Design Automation Conference
Reduction of SOC test data volume, scan power and testing time using alternating run-length codes
Proceedings of the 39th annual Design Automation Conference
Test vector decompression via cyclical scan chains and its application to testing core-based designs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test application time and volume compression through seed overlapping
Proceedings of the 40th annual Design Automation Conference
19.1 Built-In Self Testing of Sequential Circuits Using Precomputed Test Sets
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Scan Vector Compression/Decompression Using Statistical Coding
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Static Compaction Techniques to Control Scan Vector Power Dissipation
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Test Data Compression for System-on-a-Chip Using Golomb Codes
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Test Data Compression Using Dictionaries with Fixed-Length Indices
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
Packet-Based Input Test Data Compression Techniques
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Dynamic Test Compression Using Statistical Coding
ATS '01 Proceedings of the 10th Asian Test Symposium
Proceedings of the conference on Design, automation and test in Europe
Frequency-Directed Run-Length (FDR) Codes with Application to System-on-a-Chip Test Data Compression
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
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Test compression / decompression using variable-length coding is an efficient method for reducing the test application cost, i.e., test application time and the size of the storage of an LSI tester. However, some coding techniques impose slow test application, and consequently a large test application time is required despite the high compression. In this paper, we clarify the fact that test application time depends on the compression ratio and the length of codewords and then propose a new Huffman-based coding method for achieving small test application time in a given test environment. The proposed coding method adjusts both of the compression ratio and the minimum length of the codewords to the test environment. Experimental results show that the proposed method can achieve small test application time while keeping high compression ratio.