Test Compression and Hardware Decompression for Scan-Based SoCs
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Test data compression technique using selective don't-care identification
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
A Technique for High Ratio LZW Compression
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Test data compression technique for embedded cores using virtual scan chains
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Huffman-based coding with efficient test application
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
On test data compression using selective don't-care identification
Journal of Computer Science and Technology
A Variable-Length Coding Adjustable for Compressed Test Application
IEICE - Transactions on Information and Systems
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Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.