On test data volume reduction for multiple scan chain designs
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Test data compression technique using selective don't-care identification
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
On test data compression using selective don't-care identification
Journal of Computer Science and Technology
Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Scan-chain partition for high test-data compressibility and low shift power under routing constraint
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the 2009 International Conference on Computer-Aided Design
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Given a test set for stuck-at faults, a primary input value may be changed to the opposite logic value without losing fault coverage. One can regard such a value as a don't-care (X). The don't care values can be filled appropriately to achieve test compaction, test data compression, or power reduction during testing. Howevel; these uses are better served if the don't cares can be placed in desired/specific bit positions of the test patterns. In this papel; we present a methodfor maximally fixing Xs on specific bits of given test vectors. Experimental results on ISCAS benchmark circuits show how the proposed method can increase the number of Xs on specific bits compared with an earlier proposed method.