Linear Dependencies in Linear Feedback Shift Registers
IEEE Transactions on Computers
IEEE Transactions on Computers
A method for generating weighted random test pattern
IBM Journal of Research and Development
Fault coverage of a long random test sequence estimated from a short simulation
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
How Seriously Do You Take Possible-Detect Faults?
ITC '97 Proceedings of the 1997 IEEE International Test Conference
IC quality and test transparency
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Evaluation of system BIST using computational performance measures
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
| Hi-index | 0.01 |
Two ideas are Coupled to help determine the Pseudorandom test length in a self-testing environment. The first is that yield,defect level after test, and test coverage are related. Tbe second is that Fault Coverage as ta function of the number ofpseudorandom test patterns can be approximated on semilogarithmic paper an exponential curve, with statistical confidenceintervals. Merging these two concepts allows one to relate the shipped defect level as a function of the number of radomppattterns and yield, With this knowledge, the test length of pseudorandom patterns Can be Predicted in a self-test environment.