Fault Propagation Through Embedded Multiport Memories

Authors:
W. H. McAnney;J. Savir;S. R. Vecchio
Affiliations:
IBM Corp., Poughkeepsie;IBM Corp., Poughkeepsie;IBM Corp., Poughkeepsie
Venue:
IEEE Transactions on Computers
Year:
1987

Citing 3
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Abstract

An analytical method is described for determining the random pattern testability of permanent faults in the prelogic driving the data-in and the address lines of a multiport random access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.