Optimizing error masking in BIST by output data modification

An Effective BIST Scheme for ROM's

IEEE Transactions on Computers - Special issue on fault-tolerant computing

Programmable BIST Space Compactors

IEEE Transactions on Computers

Built-in-self-test with an alternating output

Proceedings of the conference on Design, automation and test in Europe

A Tutorial on Built-in Self-Test. I. Principles

IEEE Design & Test

Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output

IEEE Transactions on Computers

Aliasing Probability Calculations for Arbitrary Compaction under Independently Selected Random Test Vectors

IEEE Transactions on Computers

Aliasing-free signature analysis for RAM BIST

ITC'94 Proceedings of the 1994 international conference on Test