Built-in-self-test with an alternating output

Authors:
T. Bogue;M. Jürgensen;Y. Zorian;M. Gössel
Affiliations:
Department of Computer Science, University of Waterloo, Waterloo, Ontario, Canada, N2L 3G1;Department of Computer Science, The University of Western Ontario, London, Ontario, Canada, N6A 5B7 and Institut für Informatik, Universität Potsdam, Am Neuen Palais 10, D-14469 Potsdam, ...;Logic Vision Inc., 101 Metro Drive, San Jose, CA;Arbeitsgruppe Fehlertolerantes Rechnen, Institut für Informatik, Universität Potsdam, Am Neuen Palais 10, D-14469 Potsdam, Germany
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
1998

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Abstract

A new compaction technique based on signature analysis is presented. Rather than comparing the final signature with the expected one after the test is completed, the binary output of the MISA is converted into an alternating binary signal by two simple cover circuits. An error is indicated whenever the alternation of the output signal is disturbed. This technique results in a higher fault coverage, improved fault diagnosis capability, a greater test autonomy in core-based designs, and early fault notification.