Discrete-time signal processing (2nd ed.)
Discrete-time signal processing (2nd ed.)
A BIST scheme for on-chip ADC and DAC testing
DATE '00 Proceedings of the conference on Design, automation and test in Europe
CMOS: mixed-signal circuit design
CMOS: mixed-signal circuit design
Towards an ADC BIST Scheme Using the Histogram Test Technique
ETW '00 Proceedings of the IEEE European Test Workshop
A Time Domain Built-In Self-Test Methodology for SNDR and ENOB Tests of Analog-to-Digital Converters
ATS '04 Proceedings of the 13th Asian Test Symposium
An Output Response Analyzer Circuit for ADC Built-in Self-Test
Journal of Electronic Testing: Theory and Applications
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In order to perform an on-chip test for characterizing both static and transmission parameters of embedded analog-to-digital converters (ADCs), this paper presents an oscillator-based reconfigurable sinusoidal signal generator which can produce both high and low frequency sinusoidal signals by switching the oscillator into different modes. Analog and digital signals can additionally be produced concurrently in both modes to provide not only test stimuli, but also reference responses for the ADC built-in self-test. The generated oscillation signal amplitude and frequency can be easily and precisely controlled by simply setting the oscillator clock frequency and initial condition coefficients. Except for a 1-bit digital-to-analog converter and smoothing filter, this proposed generator is constructed entirely by digital circuits, and hence easily integrates this silicon function and verifies itself before testing the ADCs.