A new built-in self-test approach for digital-to-analog and analog-to-digital converters
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
A BIST scheme for on-chip ADC and DAC testing
DATE '00 Proceedings of the conference on Design, automation and test in Europe
A sigma-delta modulation based BIST scheme for mixed-signal circuits
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
An Analog Multi-Tone Signal Generator for Built-In Self-Test Applications
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST
Proceedings of the IEEE International Test Conference
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Bandpass delta-sigma data converters
ASILOMAR '95 Proceedings of the 29th Asilomar Conference on Signals, Systems and Computers (2-Volume Set)
Efficient and accurate testing of analog-to-digital converters using oscillation-test method
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Testing and Characterization of the One-Bit First-Order Delta-Sigma
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Self-Testing Second-Order Delta-Sigma Modulators Using Digital Stimulus
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
A dynamic ADC test processor for built-in-self-test of ADCs
ICC'08 Proceedings of the 12th WSEAS international conference on Circuits
| Hi-index | 0.00 |
This paper proposes a mixed-signal Built-In Self-Test (BIST) architecture based on a second-order delta-sigma modulator. This modulator, which incorporates a design-for-testability (DfT) circuitry, is capable of testing/characterizing itself using digital stimulus. This characteristic is attractive for implementing the modulator as an on-chip analog signal analyzer. When applied for mixed-signal BIST, the modulator-based analog signal analyzer is first characterized using digital stimulus. Then the analyzer is utilized to characterize the stimulus generator in the BIST application. Some critical implementation issues of the BIST architecture are also discussed.