BIST for D/A and A/D Converters
IEEE Design & Test
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Oscillation-test strategy for analog and mixed-signal integrated circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
A BIST scheme for on-chip ADC and DAC testing
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Implementation of a linear histogram BIST for ADCs
Proceedings of the conference on Design, automation and test in Europe
A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs
Journal of Electronic Testing: Theory and Applications
Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST
Journal of Electronic Testing: Theory and Applications
Towards an ADC BIST Scheme Using the Histogram Test Technique
ETW '00 Proceedings of the IEEE European Test Workshop
Auto-Calibrating Analog Timer for On-Chip Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Oscillation Test Strategy: A Case Study
Journal of Electronic Testing: Theory and Applications
Low Cost BIST for Static and Dynamic Testing of ADCs
Journal of Electronic Testing: Theory and Applications
Delta-sigma modulator based mixed-signal BIST architecture for SoC
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Exploring the Ability of Oscillation Based Test for Testing Continuous -Time Ladder Filters
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
A BIST Scheme for SNDR Testing of ΣΔ ADCs Using Sine-Wave Fitting
Journal of Electronic Testing: Theory and Applications
Proceedings of the conference on Design, automation and test in Europe
Testing digital low-pass filters using oscillation-based test
Microprocessors & Microsystems
A design-for-digital-testability circuit structure for Σ-Δ modulators
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Built-in-Self-Test Σ-Δ ADC Prototype
Journal of Electronic Testing: Theory and Applications
A decorrelating design-for-digital-testability scheme for Σ-Δ modulators
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Complex oscillation-based test and its application to analog filters
IEEE Transactions on Circuits and Systems Part I: Regular Papers - Special issue on ISCAS 2009
A robust ADC code hit counting technique
Proceedings of the Conference on Design, Automation and Test in Europe
Automatic linearity and frequency response tests with built-in pattern generator and analyzer
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Oscillation-based analog diagnosis using artificial neural networks based inference mechanism
Computers and Electrical Engineering
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This paper describes a practical test approach for analog-to-digital converters (ADCs) based on the oscillation-test strategy. The oscillation-test is applied to convert the ADC under test to an oscillator. The oscillation frequencies are able to monitor the ADC conversion rate, differential nonlinearity (DNL) and integral nonlinearity (INL) at each quantization band edge (QBE). Using this method, no analog stimulus should be supplied and therefore the need for a costly precision signal generator is eliminated. Besides, as the oscillation frequency is evaluated using pure digital circuitry, test accuracy is increased. This test approach is not limited to a special kind of ADC. Simulations and practical implementation prove the efficiency of the proposed test approach for ADCs.