The Design of a Testable Parallel Multiplier
IEEE Transactions on Computers
ICCAD '92 1992 IEEE/ACM international conference proceedings on Computer-aided design
Digital signal processing (3rd ed.): principles, algorithms, and applications
Digital signal processing (3rd ed.): principles, algorithms, and applications
Pseudorandom-pattern test resistance in high-performance DSP datapaths
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Frequency-domain compatibility in digital filter BIST
DAC '97 Proceedings of the 34th annual Design Automation Conference
An Effective Built-In Self-Test Scheme for Parallel Multipliers
IEEE Transactions on Computers
The VLSI handbook
Oscillation Ring Delay Test for High Performance Microprocessors
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Testing Schemes for FIR Filter Structures
IEEE Transactions on Computers
Computer Arithmetic: Principles, Architecture and Design
Computer Arithmetic: Principles, Architecture and Design
Practical Oscillation-Based Test of Integrated Filters
IEEE Design & Test
Towards 100% Testable FIR Digital Filters
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Online Self-Repair of FIR Filters
IEEE Design & Test
Efficient and accurate testing of analog-to-digital converters using oscillation-test method
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Oscillation-test strategy for analog and mixed-signal integrated circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Effective Oscillation-Based Test for application to a DTMF Filter Bank
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Oscillation Test Strategy: A Case Study
Journal of Electronic Testing: Theory and Applications
Design and test of a bit parallel 2nd order IIR filter structure
ICASSP '91 Proceedings of the Acoustics, Speech, and Signal Processing, 1991. ICASSP-91., 1991 International Conference
Redundancy and testability in digital filter datapaths
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Concurrent test for digital linear systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
An iterative logarithmic multiplier
Microprocessors & Microsystems
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In this paper, we propose a novel low-cost BIST scheme for testing low-pass FIR and IIR filters, based on the oscillation-based test (OBT). The OBT-BIST scheme developed here avoids test-pattern generation and tests the filter at-speed, without test-point insertion. We employ a systematic procedure for designing the oscillator and for obtaining the oscillation conditions in advance. The simulation results show high fault coverage for the filters under test, with low area overhead and acceptable test time.