Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Redundancy and testability in digital filter datapaths
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Testing digital low-pass filters using oscillation-based test
Microprocessors & Microsystems
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Editor's note:Chip-level failure detection has been a target of research for some time, but today's very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today's chips. This article introduces a self-repair solution for the digital FIR filter, one of the key blocks used in DSPs.ýYervant Zorian, Virage Logic