Pseudorandom-pattern test resistance in high-performance DSP datapaths

Authors:
Laurence Goodby;Alex Orailoğlu
Affiliations:
Dept. of Electrical & Computer Engineering, University of California, San Diego, La Jolla, CA;Dept. of Computer Science & Engineering, University of California, San Diego, La Jolla, CA
Venue:
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Year:
1996

Discrete-time signal processing

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