Test quality and fault risk in digital filter datagraph BIST

Authors:
Laurence Goodby;Alex Orailoğlu
Affiliations:
Design Technology Center, Agilent Technologies, Palo Alto, CA;Dept. of Computer Science & Engineering, University of California, San Diego, La Jolla, CA
Venue:
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Year:
2000

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