A Design of Linearity Built-in Self-Test for Current-Steering DAC

Authors:
Hsin-Wen Ting;Soon-Jyh Chang;Su-Ling Huang
Affiliations:
Department of Electronic Engineering, National Kaohsiung University of Applied Science, Kaohsiung, Taiwan;Department of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan;Motech Industries, Inc. (Motech), Tainan, Taiwan
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2011

Citing 6
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Abstract

In this paper, a current-mode Built-In Self-Test (BIST) scheme is proposed for on-chip estimating static non-linearity errors in current-steering digital-to-analog converters (DACs). The proposed DAC BIST scheme is designed to verify a 10-bit segmented current-steering DAC, consist of a 5-bit coarse DAC and a 5-bit fine one. This proposed BIST scheme includes a current-mode sample-and-difference circuit to increase the sampling current accuracy and control a current-controlled oscillator (ICO). In addition, only 36 measurements are required by using the selected-code method rather than 1024 measurements for the conventionally-utilized all-code method. Compared to the conventionally-utilized all-code method, about 85-% reduction of test time can be achieved.