DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
17.3 Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Low Cost BIST for Static and Dynamic Testing of ADCs
Journal of Electronic Testing: Theory and Applications
Lookup table based simulation and statistical modeling of Sigma-Delta ADCs
Proceedings of the 43rd annual Design Automation Conference
A First Step for an INL Spectral-Based BIST: The Memory Optimization
Journal of Electronic Testing: Theory and Applications
A Design-Based Structural Test Method for a Switched-Resistor DAC
Journal of Electronic Testing: Theory and Applications
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This paper proposes a method to estimate the IntegralNon-Linearity of AD-converters from the lower orderoutput Fourier coefficients of a sinusoidal input. In orderto get a high quality estimate, the lower order Fouriercoefficients have to be stabilized with respect to therounding operation of the AD-converter. For this we use acomputationally efficient and easily applied methodnamed wobbling.