DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
A New Approach for Nonlinearity Test of ADCs/DACs and its Application for BIST
ETW '99 Proceedings of the 1999 IEEE European Test Workshop
Estimating the Integral Non-Linearity of Ad-Converters via the Frequency Domain
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Linearity Testing Issues of Analog to Digital Converters
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Investigation into the Use of Hybrid Solutions for ΣΔ A/D Converter Testing
Journal of Electronic Testing: Theory and Applications
A Built-in-Self-Test Σ-Δ ADC Prototype
Journal of Electronic Testing: Theory and Applications
An Output Response Analyzer Circuit for ADC Built-in Self-Test
Journal of Electronic Testing: Theory and Applications
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This paper presents two new march test algorithms, MT-R3CF and MT-R4CF, for detecting reduced 3-coupling and 4-coupling faults, respectively, in n × 1 random-access memories (RAMs). To reduce the length of the tests, only the ...