DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST
Proceedings of the IEEE International Test Conference
A New Approach for Nonlinearity Test of ADCs/DACs and its Application for BIST
ETW '99 Proceedings of the 1999 IEEE European Test Workshop
Estimating the Integral Non-Linearity of Ad-Converters via the Frequency Domain
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Proceedings of the conference on Design, automation and test in Europe - Volume 1
| Hi-index | 0.00 |
Integral non-linearity (INL) is the main static parameter of analog-to-digital converter. This paper presents a comparison between different INL test techniques based on INL estimation from the spectrum of the converted signal. The most common technique is based on polynomial fitting of the INL curve. This technique is well suited to the estimation of a smooth INL curve without sharp transitions. The new method described in the paper is based on a Fourier series expansion of the INL curve. We demonstrate that this new technique allows a more efficient INL estimation. The comparison between the two techniques has been realized thanks to a metrics that considers the uncertainty of production test measurements. Finally, we propose a first step of the study of implementation feasibility of the INL estimation technique. This study focus only on the optimization of required memory.