DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
On-Chip Evaluation of Oscillation-Based-Test Output Signals for Switched-Capacitor Circuits
Analog Integrated Circuits and Signal Processing
Practical Oscillation-Based Test of Integrated Filters
IEEE Design & Test
Testing analog and mixed-signal integrated circuits using oscillation-test method
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A First Step for an INL Spectral-Based BIST: The Memory Optimization
Journal of Electronic Testing: Theory and Applications
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This paper presents a method for extracting, in the digital domain, the main characteristic parameters of an analog sine-wave signal. The required circuitry for on-chip implementation is very simple and robust, which makes the present approach very suitable for BIST applications. Solutions in this sense are addressed together with simulation results that validate the feasibility of the proposed approach.