A Design-Based Structural Test Method for a Switched-Resistor DAC

Authors:
Lei Ma;Geert Seuren;Robert Van Rijsinge;Corné Bastiaansen;Leon Van Dussen
Affiliations:
Philips Semiconductors IC Manufacturing Operations---Test Innovation Centre, Nijmegen, The Netherlands 6534 AE;Philips Semiconductors Chief Technology Office---Process Library Technology, Eindhoven, The Netherlands 5656 AA;Philips Semiconductors IC Manufacturing Operations---Test Innovation Centre, Nijmegen, The Netherlands 6534 AE;Philips Semiconductors Chief Technology Office---Process Library Technology, Eindhoven, The Netherlands 5656 AA;Philips Semiconductors Chief Technology Office---Process Library Technology, Eindhoven, The Netherlands 5656 AA
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2007

Citing 3
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Abstract

In this paper, a design-based structural testing method is presented to enable a fast, low cost test for a switched-resistor digital-to-analogue converter (DAC). A 24-bit stereo DAC is used to demonstrate this. After schematic-level simulations and experimental verification, it is found that the dynamic parameter THD can be predicted by the static test. Practical production wafer test and final test results evaluate this structural test method by comparing it with the traditional THD test method. In this paper the simulation results, the relevant measurement results, and the testing results are discussed. Finally, the application recommendations are given.