Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure

Authors:
F. Azaïs;S. Bernard;Y. Bertrand;M. Comte;M. Renovell
Affiliations:
LIRMM—CNRS/University of Montpellier, 161, Rue Ada, 34392 Montpellier, Cedex 5, France;LIRMM—CNRS/University of Montpellier, 161, Rue Ada, 34392 Montpellier, Cedex 5, France;LIRMM—CNRS/University of Montpellier, 161, Rue Ada, 34392 Montpellier, Cedex 5, France;LIRMM—CNRS/University of Montpellier, 161, Rue Ada, 34392 Montpellier, Cedex 5, France;LIRMM—CNRS/University of Montpellier, 161, Rue Ada, 34392 Montpellier, Cedex 5, France
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2004

Citing 4
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Abstract

ADCs are fully characterized by both static and dynamic parameters. Testing methods usually combine a histogram-based approach with a spectral analysis to determine the complete set of ADCs parameters. In the view of a unique test procedure, this paper investigates the correlation between both kinds of parameters. Experimental results demonstrate that under appropriate test conditions, the dynamic parameters extracted from a classical FFT exhibit significant variations against ADC offset, gain and non-linearity errors, opening the way of a low-cost test strategy in the frequency domain.