Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling

Authors:
R. De Vries;A. J. E. M. Janssen
Affiliations:
Philips Semiconductors, 811 E. Arques Ave, Sunnyvale, CA 94088-3409, USA. Ronald.deVries@sv.sc.philips.com;Philips Research Lab., Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands. janssena@natlab.research.philips.com
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
1999

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Abstract

In this paper we propose a new technique, wobbling, for thestabilization of spectral ADC-test parameters with respect tooffset and amplitude deviations of the sinusoidal stimulus. Wobblingaims at removing the effect of the rounding operation that takesplace in an ADC, so that the measured harmonic distortion and noiseamplitude can be truly ascribed to the intrinsic non-linearity andnoise of the ADC. We compare the wobbling technique with subtractiveand non-subtractive noise dithering, both from a performance and animplementation point-of-view. We present results of simulations andmeasurements validating the wobbling technique for use in aproduction environment.