DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
Mix Test: A Mixed-Signal Extension to a Digital Test System
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Fault Models and Test Generation for OpAmp Circuits—The FFM
Journal of Electronic Testing: Theory and Applications
Estimating the Integral Non-Linearity of Ad-Converters via the Frequency Domain
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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In this paper we propose a new technique, wobbling, for the stabilization of spectral ADC-test parameters with respect to offset and amplitude deviations of the sinusoidal stimulus. Wobbling aims at removing the effect of the rounding operation that takes place in an ADC, so that the measured harmonic distortion and noise amplitude can be truly ascribed to the intrinsic non-linearity and noise of the ADC. We compare the wobbling technique with subtractive and non-subtractive noise dithering, both from a performance and an implementation point-of-view. We present results of simulations and measurements validating the wobbling technique for use in a production environment.