Incorporation of hard-fault-coverage in model-based testing of mixed-signal ICs

• Authors:

• Carsten Wegener;Michael Peter Kennedy

• Affiliations:

• University College Cork, Lee Maltings, Prospect Row, Cork, Ireland;University College Cork, Lee Maltings, Prospect Row, Cork, Ireland

• Venue:
• DATE '00 Proceedings of the conference on Design, automation and test in Europe
• Year:
• 2000