Nyquist data converter testing and yield analysis using behavioral simulation

Authors:
Edward W. Y. Liu;Alberto L. Sangiovanni-Vincentelli
Affiliations:
Department of EECS, University of California, Berkeley, CA;Department of EECS, University of California, Berkeley, CA
Venue:
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Year:
1993

Numerical recipes in Pascal: the art of scientific computing

Numerical recipes in Pascal: the art of scientific computing
Cutting the high cost of testing

IEEE Spectrum
Analog system verification in the presence of parasitics using behavioral simulation

DAC '93 Proceedings of the 30th international Design Automation Conference
Delay fault coverage and performance tradeoffs

DAC '93 Proceedings of the 30th international Design Automation Conference
Behavioral simulation for noise in mixed-mode sampled-data systems

ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Linear Error Modeling of Analog and Mixed-Signal Devices

Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner

Statistical behavioral modeling and characterization of A/D converters

ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design

Hi-index	0.00