Principles of CMOS VLSI design: a systems perspective
Principles of CMOS VLSI design: a systems perspective
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Linear Error Modeling of Analog and Mixed-Signal Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Circuit Design for Built-in Current Testing
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
iDD Pulse Response Testing of Analog and Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Very-Low-Voltage Testing for Weak CMOS Logic ICs
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Hierarchical ATPG for Analog Circuits and Systems
IEEE Design & Test
Low-power, high-performance analog neural branch prediction
Proceedings of the 41st annual IEEE/ACM International Symposium on Microarchitecture
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This article describes a method for testing A/D converters using current testing. This method achieves real-time current testing without any need to analyze the results of testing. We also examine the effectiveness of fault detection by current testing combined with variable power supply voltage testing. The current testing used in this article measures the integral of the power supply current during one clock period when a test vector is applied. The target circuit is a 2-bit CMOS A/D converter and target faults are resistive bridging faults and resistive-capacitive breaking faults. Simulation results show that a step-voltage input stimulus is effective for detecting these faults in the A/D converter because this input stimulus allows the current to be measured at discrete time intervals. Moreover, in a variable power supply voltage environment, fault detection by current testing becomes easier as the power supply voltage becomes higher.