On-Line Testing for VLSI—A Compendium of Approaches
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
A Low-Loss Built-In Current Sensor
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Analog Integrated Circuits and Signal Processing
Real-Time Current Testing for A/D Converters
IEEE Design & Test
A Unified Design Methodology for Offline and Online Testing
IEEE Design & Test
Analysis of ISSQ/IDDQ Testing Implementation and Circuit Partitioning in CMOS Cell-Based Design
EDTC '96 Proceedings of the 1996 European conference on Design and Test
A differential built-in current sensor design for high speed IDDQ testing
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
AN IDDQ SENSOR CIRCUIT FOR LOW-VOLTAGE ICS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
A simple built-in current sensor for IDDQ testing of CMOS data converters
Integration, the VLSI Journal
A simple built-in current sensor for IDDQ testing of CMOS data converters
Integration, the VLSI Journal
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