Test Generation for Current Testing (CMOS ICs)
IEEE Design & Test
Circuit Design for Built-in Current Testing
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
An approach for system tests design and its application
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
| Hi-index | 0.00 |
A concept of a design through technology both for offline and online testing is described. It can be used for any level of a multilevel hierarchical computer system from a system till a gate level, separately or in possible mixed-level combinations.A technology is based on disjoining of testing algorithms and a test management The management is different for offline and online testing At the same time an algorithm may be the identical for both types of testing.Disjoining is achieved by introducing a unified structure of a test: only standard basic constructions are usedfor its design accordingly to a special order.