System identification: theory for the user
System identification: theory for the user
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
Journal of Electronic Testing: Theory and Applications
Analog and Digital Control System Design: Transfer-function, State-space, and Algebraic Methods
Analog and Digital Control System Design: Transfer-function, State-space, and Algebraic Methods
Test Limitations of Parametric Faults in Analog Circuits
ATS '02 Proceedings of the 11th Asian Test Symposium
On the Detectability of Parametric Faults in Analog Circuits
ICCD '02 Proceedings of the 2002 IEEE International Conference on Computer Design: VLSI in Computers and Processors (ICCD'02)
Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Testability analysis of analog systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Coefficient-based method is introduced for the parametric faults detection in analog circuits. By use of pseudo Monte-Carlo simulation we can greatly speed up the calculation of bounds of CUT transfer function's coefficients. We can estimate transfer function's actual numeric coefficients with system identification method. There is no need for a apriori knowledge of the symbolic transfer function. Finally we show that it is possible to determine whether any given CUT is faulty.