Coefficient-based parametric faults detection in analog circuits
Proceedings of the 13th ACM Great Lakes symposium on VLSI
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A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present