Test Limitations of Parametric Faults in Analog Circuits

Authors:
Jacob Savir;Zhen Guo
Affiliations:
-;-
Venue:
ATS '02 Proceedings of the 11th Asian Test Symposium
Year:
2002

Citing 0
Cited 2

Coefficient-based parametric faults detection in analog circuits

Proceedings of the 13th ACM Great Lakes symposium on VLSI
Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing

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Abstract

This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits.We show that there are inherent limitations with regard to analog faults detectability.