Frequency-domain compatibility in digital filter BIST
DAC '97 Proceedings of the 34th annual Design Automation Conference
Efficient analog test methodology based on adaptive algorithms
DAC '98 Proceedings of the 35th annual Design Automation Conference
Analog test design with IDD measurements for the detection of parametric and catastrophic faults
Proceedings of the conference on Design, automation and test in Europe
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Journal of Electronic Testing: Theory and Applications
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Proceedings of the conference on Design, automation and test in Europe
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IEEE Transactions on Circuits and Systems II: Express Briefs
Automatic linearity and frequency response tests with built-in pattern generator and analyzer
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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This article is a tutorial covering the introduction of frequency domain analysis for the testing of mixed-signal devices. The article covers dynamic testing of analog-to-digital converters using Fourier analysis. It is aimed at digital design and test engineers making the transition from devices with digital only content to devices with both digital and analog or mixed-signal content. The article introduces the test methodologies for Fourier analysis including coherent sampling techniques. It also covers the challenges of implementing these techniques in a real system including analyzing the results to identify test implementation problems.