Discrete-time signal processing (2nd ed.)
Discrete-time signal processing (2nd ed.)
Frequency Domain Testing of ADCs
IEEE Design & Test
An FFT Approximation Technique Suitable for On-Chip Generation and Analysis of Sinusoidal Signals
DFT '03 Proceedings of the 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for the signal analysis is the Fast Fourier Transform (FFT algorithms). Such complex algorithms are not suitable for BIST (Built-In Self-Test) or BOST (Built-Off Self-Test) solutions due to their high demand for resources. In this paper, the Goertzel algorithm will be presented as an alternative to FFT algorithms. A new optimized structure of the Goertzel algorithm and its implementation in an FPGA (Field Programmable Gate Array) is presented. A comparison within the scope of the production test of RF transceiver devices shows a considerable reduction of the test time (factor 6) and resources (factor 10) compared to a FFT software solution respectively hardware solution.