Testability analysis and multi-frequency ATPG for analog circuits and systems

Authors:
Sam D. Huynh;Seongwon Kim;Mani Soma;Jinyan Zhang
Affiliations:
University of Washington, Department of Electrical Engineering;University of Washington, Department of Electrical Engineering;University of Washington, Department of Electrical Engineering;University of Washington, Department of Electrical Engineering
Venue:
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Year:
1998

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