CMOS open defect detection by supply current test

Principles of CMOS VLSI design: a systems perspective

Principles of CMOS VLSI design: a systems perspective

IDDT Testing versus IDDQ Testing

Journal of Electronic Testing: Theory and Applications

Transient Power Supply Current Testing of Digital CMOS Circuits

Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test

Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data

Proceedings of the IEEE International Test Conference

Testing for Floating Gates Defects in CMOS Circuits

ATS '98 Proceedings of the 7th Asian Test Symposium

Transient Current Testing Based on Current (Charge) Integration

IDDQ '98 Proceedings of the IEEE International Workshop on IDDQ Testing

Transient Current Testing of 0.25 µm CMOS Devices

ITC '99 Proceedings of the 1999 IEEE International Test Conference