CMOS open defect detection by supply current test
Proceedings of the conference on Design, automation and test in Europe
Performance Comparison of VLV, ULV, and ECR Tests
Journal of Electronic Testing: Theory and Applications
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Comparison of Defect Detection Capabilities of Current-Based and Voltage-Based Test Methods
ETW '00 Proceedings of the IEEE European Test Workshop
Comparison of Defect Detection Capabilities of Current-Based and Voltage-Based Test Methods
ETW '00 Proceedings of the IEEE European Test Workshop
An Analysis of the Delay Defect Detection Capability of the ECR Test Method
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Test Method Evaluation Experiments & Data
ITC '00 Proceedings of the 2000 IEEE International Test Conference
The Future of Delta IDDQ Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Practical Application of Energy Consumption Ratio Test
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Statistical Threshold Formulation For Dynamic Idd Test
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Defect Detection using Power Supply Transient Signal Analysis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Transient Current Testing of 0.25 µm CMOS Devices
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Scaling of iDDT Test Methods for Random Logic Circuits
Journal of Electronic Testing: Theory and Applications
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