A novel wavelet transform based transient current analysis for fault detection and localization
Proceedings of the 39th annual Design Automation Conference
Detecting delay faults using power supply transient signal analysis
Proceedings of the IEEE International Test Conference 2001
Predicting Device Performance From Pass/Fail Transient Signal Analysis Data
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Defect Detection using Power Supply Transient Signal Analysis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current
Journal of Electronic Testing: Theory and Applications
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Transient Signal Analysis (TSA) is a parametric device testingtechnique based on the analysis of dynamic (transient) current(i{DDT}) drawn by the core logic from the power supply pads in aCMOS digital circuit. In previous work, we develop a test procedurethat can be used both to detect signal variations caused bydefects and to obtain delay information in defect free chips. Phasespectra of transient signals obtained using discrete Fourier transformare shown to track path delays of defect-free chips under awide range of process variations. However, in recent work, wewere able to demonstrate through simulation experiments incorporatingdeep submicron transistor models, a circuit design andpath sensitization scenario in which our existing TSA method isnot able to yield accurate predictions of path delays. More specifically,a circuit composed of two inverter chains constructed withwidely varying transistor sizes was shown to produce path delaysthat were weakly correlated across a set of worst case processmodels. In this paper, an alternative wavelet-based analysis ofi{DDT} waveforms is shown to improve the accuracy of predictingmultiple path delays under these conditions.