IDDQ Testing of CMOS Opens: An Experimental Study

Fault simulation of interconnect opens in digital CMOS circuits

ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design

A Low-Loss Built-In Current Sensor

Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop

Fault models and test generation for IDDQ testing: embedded tutorial

ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference

Detectability Conditions of Full Opens in the Interconnections

Journal of Electronic Testing: Theory and Applications

Toward understanding "Iddq-only" fails

ITC '98 Proceedings of the 1998 IEEE International Test Conference

CMOS IC reliability indicators and burn-in economics

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Differential Sensing Strategy for Dynamic Thermal Testing of ICs

VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium

An Analysis of the Delay Defect Detection Capability of the ECR Test Method

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Testing for Resistive Opens and Stuck Opens

ITC '01 Proceedings of the 2001 IEEE International Test Conference

AN IDDQ SENSOR CIRCUIT FOR LOW-VOLTAGE ICS

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data

ITC '97 Proceedings of the 1997 IEEE International Test Conference

THE FAIL-STOP CONTROLLER AE11

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Defect Detection using Power Supply Transient Signal Analysis

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors

Journal of Electronic Testing: Theory and Applications