Monitoring Power Dissipation for Fault Detection
Journal of Electronic Testing: Theory and Applications
Deep submicron defect detection with the energy consumption ratio
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Fault Detection and Location Using IDD Waveform Analysis
IEEE Design & Test
Process-tolerant test with energy consumption ratio
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Replacing IDDQ Testing: With Variance Reduction
Journal of Electronic Testing: Theory and Applications
FFT-based test of a yield monitor circuit
DFT '95 Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
On the Comparison of IDDQ and IDDQ Testing
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
An Analysis of the Delay Defect Detection Capability of the ECR Test Method
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Improving Delta-IDDQ-based test methods
ITC '00 Proceedings of the 2000 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
An Histogram Based Procedure for Current Testing of Active Defects
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Defect Detection using Power Supply Transient Signal Analysis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Testing and Reliability Techniques for High-Bandwidth Embedded RAMs
Journal of Electronic Testing: Theory and Applications
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Graphical IDDQ signatures reduce defect level and yield loss
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Abstract: This paper presents the bases of a test method that can detect and locate faults and defects. This method is based on the use of digital signal processing applied on sampled current or voltage and can be applied to technologies with significant quiescent current. A simple procedure is also proposed in order to locate parasitic resistive contacts, and diagnosis potential of the method is explored.