Switched-current delta-sigma A/D converters
Analog Integrated Circuits and Signal Processing - Special issue: selected articles from the 1994 NORCHIP seminar
Built-in self test of S2I switched current circuits
Analog Integrated Circuits and Signal Processing - Special issue: selected articles from the 1994 NORCHIP seminar
Fundamentals of Artificial Neural Networks
Fundamentals of Artificial Neural Networks
Design and Self-Test for Switched-Current Building Blocks
IEEE Design & Test
BISTing Switched-Current Circuits
ATS '98 Proceedings of the 7th Asian Test Symposium
Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks
Journal of Electronic Testing: Theory and Applications
A novel wavelet transform-based transient current analysis for fault detection and localization
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Neural Network-Based Technique for Detecting Catastrophic and Parametric Faults in Analog Circuits
ICSENG '05 Proceedings of the 18th International Conference on Systems Engineering
Switched-current circuits test using pseudo-random method
Analog Integrated Circuits and Signal Processing
A Fuzzy Wavelet Neural Network Model for System Identification
ISDA '09 Proceedings of the 2009 Ninth International Conference on Intelligent Systems Design and Applications
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Combining the time and frequency location and multiple-scale analysis of wavelet transform with the nonlinear mapping and generalizing of neural network, an efficient defect-oriented parametric test method using Wavelet Neural Network (WNN) for switched-current integrated circuits is proposed. Contraposing to the fully compatible digital CMOS technology and current scaling calculation of SI circuits, parameter cohort of switched current elements is used to compute the sensitivity and gain tolerance and is applied for selecting the test models. The selecting of the appropriate wavelet function based on particular switched current fault signal is discussed, and the number of network input and output nodes are determined by the circuit status and dimension of eigenvector which is the energy of wavelet decomposition coefficient. To simplify configuration of the neural network, the sampled data was preprocessed by wavelet transform. Illustrative examples show that the proposed wavelet neural network method for testing of switched current circuits is effective.