Switched-current circuits test using pseudo-random method

Authors:
Guo Jierong;He Yigang;Tang Shengxue;Li Hongmin;Liu Meirong;Liu Hui
Affiliations:
College of Electrical and Information Engineering, Hunan University, Changsha, China 410082 and Institute of Information technology, Hunan university of Arts and Science, Changde, China 415000;College of Electrical and Information Engineering, Hunan University, Changsha, China 410082;College of Electrical and Information Engineering, Hunan University, Changsha, China 410082;College of Electrical and Information Engineering, Hunan University, Changsha, China 410082;College of Electrical and Information Engineering, Hunan University, Changsha, China 410082;College of Electrical and Information Engineering, Hunan University, Changsha, China 410082
Venue:
Analog Integrated Circuits and Signal Processing
Year:
2007

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Abstract

A built in Pseudo-Random sequence testing for testing embedded switched-current filters is described in this paper. The generation approach of Pseudo-Random sequence and the match for z functions of switched-current filters is analyzed and calculated. Taking into account of the connection between special structural problems and CMOS's parameters in switched current circuits such as the drain-gate capacitance C dg , gate-source capacitance C gs and transconductance g m., a integrated fault model for testing is constituted. A 6-order switched-current low-pass filter has been tested based on catastrophic and parametric fault models. The technique does not intrude into the actual design of the switched-current blocks, Pseudo-Random sequence generated from existing digital hardware and analogue output pins are not required.