Combining Functional and Structural Approaches for Switched-Current Circuit Testing
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Test and Testability of a Monolithic MEMS for Magnetic Field Sensing
Journal of Electronic Testing: Theory and Applications
17.1 Design-For-Testability for Switched-Current Circuits
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
AN ON-LINE SELF-TESTING SWITCHED-CURRENT INTEGRATOR
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Switched-current circuits test using pseudo-random method
Analog Integrated Circuits and Signal Processing
Fault dictionary based switched current circuit fault diagnosis using entropy as a preprocessor
Analog Integrated Circuits and Signal Processing
Wavelet Neural Network Approach for Testing of Switched-Current Circuits
Journal of Electronic Testing: Theory and Applications
Implicit functional testing of switched current filter based on fault signatures
Analog Integrated Circuits and Signal Processing
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Switched-current designs are receiving increasing interest within the VLSI community as the technique allowing analogue functions to be implemented on a digital process. In addition, switched-current designs tend to be robust and compatible with the trend for reduced supply voltages. This article describes the design of a novel type of switched-current memory cell with a built-in-self-test option. The cell is digitally controlled and can be used as a building block for a range of analogue functions. A divide-by-two circuit for reference signal generation in algorithmic A-to-D converters is given as an example application.Furthermore, two self-test approaches for these building blocks are described and their effectiveness evaluated. Over 3000 single faults have been simulated in HSPICE to obtain the fault coverage using an open/short fault model. The self-test functions are easy to apply, need only a very small overhead and result in fault coverages up to 95% for shorts and 60% for open-circuits.The analysis of undetected faults revealed that certain circuit structures used in the demonstrators which are common to analogue and mixed-signal designs are practically untestable.