Switched-current circuits test using pseudo-random method
Analog Integrated Circuits and Signal Processing
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing
Journal of Electronic Testing: Theory and Applications
Fault dictionary based switched current circuit fault diagnosis using entropy as a preprocessor
Analog Integrated Circuits and Signal Processing
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This paper aims at defining an efficient test strategy for switched-current circuit testing. Taking into account the specificity of these circuits, we propose an original structural test technique as an alternative to traditionally-used functional verification. This technique is validated both at the cell and block levels. Test results demonstrate that a high fault coverage can be achieved with a low cost test procedure. A mixed strategy combining benefits of functional and structural approaches is derived