Ten lectures on wavelets
IC test using the energy consumption ratio
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Fault Detection and Location Using IDD Waveform Analysis
IEEE Design & Test
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
iDD Pulse Response Testing of Analog and Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Transient Current Testing Based on Current (Charge) Integration
IDDQ '98 Proceedings of the IEEE International Workshop on IDDQ Testing
Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Decoupling capacitance allocation and its application to power-supply noise-aware floorplanning
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Wavelet Neural Network Approach for Testing of Switched-Current Circuits
Journal of Electronic Testing: Theory and Applications
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Transient current (IDD) testing has been often cited and investigated as an alternative and/or supplement to quiescent current (IDDQ) testing. In this correspondence, we present a novel integrated method for fault detection and localization using wavelet transform-based IDD wave-form analysis. The time-frequency resolution property of wavelet transform helps us detect as well as localize faults in digital CMOS circuits. Experiments performed on measured data from a fabricated 8-bit shift register, and simulation data from more complex circuits show promising results for both detection and localization. Wavelet-based detection method shows better sensitivity than spectral and time-domain methods. Effectiveness of the localization method in presence of complex power supply network, measurement noise, and process variation is also addressed.