On-chip transient current monitor for testing of low-voltage CMOS IC
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Dynamic Power Supply Current Testing of CMOS SRAMs
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
A novel wavelet transform based transient current analysis for fault detection and localization
Proceedings of the 39th annual Design Automation Conference
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Power supply current detectability of SRAM defects
ATS '95 Proceedings of the 4th Asian Test Symposium
SRAM Test Using On-Chip Dynamic Power Supply Current Sensor
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
The Future of Delta IDDQ Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Transient Current Testing of 0.25 µm CMOS Devices
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Testing and Reliability Techniques for High-Bandwidth Embedded RAMs
Journal of Electronic Testing: Theory and Applications
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