SRAM Test Using On-Chip Dynamic Power Supply Current Sensor

Authors:
Jian Liu;Rafic Z. Makki
Affiliations:
-;-
Venue:
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
Year:
1998

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Abstract

We present an overview of power supply current testing of SRAMs and propose a test method to improve the CMOS SRAM test efficiency by using on chip dynamic power supply current sensors. It is shown that the test method provides full observability of cell switching and allows for a significant reduction in test time. The test length is O(n) including coupling faults.