Transient power supply current monitoring—a new test method for CMOS VLSI circuits
Journal of Electronic Testing: Theory and Applications
Low Power Design in Deep Submicron Electronics
Low Power Design in Deep Submicron Electronics
Process-tolerant test with energy consumption ratio
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test of CMOS Circuits Based on its Energy Consumption
IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
An approach to dynamic power consumption current testing of CMOS ICs
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Dynamic Power Supply Current Testing of CMOS SRAMs
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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