Exploring the combination of IDDQ and iDDt testing: energy testing
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Minimized Power Consumption for Scan-Based BIST
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Energy Saving Testing of Circuits
Automation and Remote Control
Application-driven processor design exploration for power-performance trade-off analysis
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing
Journal of Electronic Testing: Theory and Applications
On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level
Journal of Electronic Testing: Theory and Applications
Dynamic Functional Unit Assignment for Low Power
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Reduction of CMOS Power Consumption and Signal Integrity Issues by Routing Optimization
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Dynamic functional unit assignment for low power
The Journal of Supercomputing
Decoupling capacitors for multi-voltage power distribution systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Design of variable input delay gates for low dynamic power circuits
PATMOS'05 Proceedings of the 15th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
The smallest ARIA module with 16-bit architecture
ICISC'06 Proceedings of the 9th international conference on Information Security and Cryptology
Process-Variation and Temperature Aware SoC Test Scheduling Technique
Journal of Electronic Testing: Theory and Applications
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